China slams US regulator’s move to ban labs from electronic testing

BEIJING: China on Friday slammed a proposal from a US regulator that would bar its labs from testing electronic devices for use in the United States, saying it undermined bilateral trade relations.

The Federal Communications Commission (FCC) voted Thursday to advance the proposal which, if green-lit, would hit devices ranging from smartphones to cameras.

Around 75 percent of certified devices in the United States are tested in recognised labs in China, the FCC estimates.